MOL-32227 Electron Microscopy, 6 cr
Implementation MOL-32227 2016-01
Lessons
Period |
1 - 2
|
Methods of instruction |
Luento |
Person responsible |
Mari Honkanen, Essi Sarlin, Minnamari Vippola |
Assessment scale
Numerical evaluation scale (0-5)
MOL-32227 Electron Microscopy/Lec/01 |
Thu 01.09.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 08.09.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 15.09.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 22.09.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 29.09.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 06.10.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 13.10.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 27.10.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 03.11.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 10.11.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 17.11.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 24.11.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 01.12.2016 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 |
Thu 08.12.2016 |
14:00 - 16:00 |
Study material
Type |
Name |
Author |
ISBN |
Additional information |
Language |
Examination material |
Book |
Transmission electron microscopy : a textbook for materials science |
David B. Williams and C. Barry Carter |
|
|
Suomi |
Yes |
Book |
Scanning Electron Microscopy and X-ray Microanalysis : Third Edition |
Goldstein, Joseph; Newbury, Dale E.; Joy, David C. |
|
|
Suomi |
Yes |
Lecture slides |
|
|
|
|
Suomi |
Yes |