MOL-32227 Electron Microscopy, 6 cr
Implementation MOL-32227 2017-01
Lessons
| Period |
1 - 2
|
| Methods of instruction |
Luento |
| Person responsible |
Mari Honkanen, Essi Sarlin, Minnamari Vippola |
Assessment scale
Numerical evaluation scale (0-5)
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 31.08.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 07.09.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 14.09.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 21.09.2017 |
14:00 - 17:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 28.09.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 05.10.2017 |
14:00 - 17:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 12.10.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 26.10.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 02.11.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 09.11.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 16.11.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 23.11.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 30.11.2017 |
14:00 - 16:00 |
| MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 07.12.2017 |
14:00 - 16:00 |
Study material
| Type |
Name |
Author |
ISBN |
Additional information |
Language |
Examination material |
| Book |
Transmission electron microscopy : a textbook for materials science |
David B. Williams and C. Barry Carter |
|
|
Suomi |
Yes |
| Book |
Scanning Electron Microscopy and X-ray Microanalysis : Third Edition |
Goldstein, Joseph; Newbury, Dale E.; Joy, David C. |
|
|
Suomi |
Yes |
| Lecture slides |
|
|
|
|
Suomi |
Yes |
