MOL-32227 Electron Microscopy, 6 cr
Toteutuskerta MOL-32227 2017-01
Opetus
Periodi |
1 - 2
|
Opetusmuodot |
Luento |
Vastuuhenkilö |
Mari Honkanen, Essi Sarlin, Minnamari Vippola |
Arvosteluasteikko
Numerical evaluation scale (0-5)
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 31.08.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 07.09.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 14.09.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 21.09.2017 |
14:00 - 17:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 28.09.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 05.10.2017 |
14:00 - 17:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 12.10.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 26.10.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 02.11.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 09.11.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 16.11.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 23.11.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 30.11.2017 |
14:00 - 16:00 |
MOL-32227 Electron Microscopy/Lec/01 (*) |
Thu 07.12.2017 |
14:00 - 16:00 |
Oppimateriaali
Tyyppi |
Nimi |
Tekijä |
ISBN |
Lisätiedot |
Kieli |
Tenttimateriaali |
Book |
Transmission electron microscopy : a textbook for materials science |
David B. Williams and C. Barry Carter |
|
|
Suomi |
Yes |
Book |
Scanning Electron Microscopy and X-ray Microanalysis : Third Edition |
Goldstein, Joseph; Newbury, Dale E.; Joy, David C. |
|
|
Suomi |
Yes |
Lecture slides |
|
|
|
|
Suomi |
Yes |