MOL-32227 Electron Microscopy, 6 cr

Toteutuskerta MOL-32227 2017-01

Opetus

Periodi 1 - 2
Opetusmuodot Luento
Vastuuhenkilö Mari Honkanen, Essi Sarlin, Minnamari Vippola

Arvosteluasteikko

Numerical evaluation scale (0-5)

MOL-32227 Electron Microscopy/Lec/01 (*) Thu 31.08.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 07.09.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 14.09.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 21.09.2017 14:00 - 17:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 28.09.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 05.10.2017 14:00 - 17:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 12.10.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 26.10.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 02.11.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 09.11.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 16.11.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 23.11.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 30.11.2017 14:00 - 16:00
MOL-32227 Electron Microscopy/Lec/01 (*) Thu 07.12.2017 14:00 - 16:00

Oppimateriaali

Tyyppi Nimi Tekijä ISBN Lisätiedot Kieli Tenttimateriaali
Book Transmission electron microscopy : a textbook for materials science David B. Williams and C. Barry Carter Suomi Yes
Book Scanning Electron Microscopy and X-ray Microanalysis : Third Edition Goldstein, Joseph; Newbury, Dale E.; Joy, David C. Suomi Yes
Lecture slides Suomi Yes