MOL-32366 Advanced Materials Characterization, 5 cr
Lisätiedot
Suitable for postgraduate studies.
Vastuuhenkilö
Mari Honkanen, Essi Sarlin, Minnamari Vippola
Osaamistavoitteet
Principles of transmission electron microscopy (TEM) including operation, image and contrast formation, electron diffraction and microanalysis. Principles of X-ray diffraction (XRD, SAXS and WAXS) methods inclusing operation and data analysis. To apply this information in practical exercises. To understand and apply suitable specimen preparation techniques. To identify special analysis techniques.
Sisältö
| Sisältö | Ydinsisältö | Täydentävä tietämys | Erityistietämys |
| 1. | Transmission elecrron microscopy Electron diffraction Microanalysis in TEM X-ray diffraction (XRD) Data analysis in SAXS and WAXS Special techniques Sample preparation |
Esitietovaatimukset
| Opintojakso | P/S | Selite |
| MOL-32228 Electron Microscopy | Mandatory |
Vastaavuudet
Opintojakso ei vastaan mitään toista opintojaksoa