2803011
ELECTRON MICROSCOPY,
ELECTRON MICROSCOPY, 3 ov
Tietoa luennoitsijoista
Professor TOIVO LEPISTÖ
Viikottainen opetus/periodi |
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Luennot (h): |
2+ |
2 |
- |
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Harjoitukset (h): |
1+ |
1 |
- |
- |
- |
Sisältö
Scanning electron microscopy, operation, image and contrast formation, specimen preparation. Microanalyzing with EDS and WDS, correction calculations, computer programs, image analysis, practical applications.
Tutkintovaatimukset
Examination on lectures and literature. Passed exercises.
Kirjallisuus
J.I.Goldstein ym.: Scanning Electron Microscopy and X-ray Microanalysis, Kluwer Academic Publisher, New York 2003. L. Reimer: Scanning Electron Microscopy, Springer-Verlag, SLT 1998.