TTKK Opinto-opas
2803011 Electron Microscopy, 3 ov
Electron Microscopy, 3 cu
Professor TOIVO LEPISTÖ
Lectures 28h. Exercises 14h.
| Viikottainen Opetus / Periodi |
S1 | S2 | K1 | K2 | Kesä |
|---|
| Luennot (h) | 2 | 2 |
- | - | - |
|---|
| Harjoitukset (h) | 1 | 1 |
- | - | - |
|---|
Sisältö
Scanning electron microscopy, operation, image and contrast formation,
specimen preparation. Microanalyzing with EDS and WDS, correction
calculations, computer programs, image analysis, practical applications.
Tutkintovaatimukset
Examination on lectures and literature. Passed exercises.
Kirjallisuus
J.I.Goldstein ym.: Scanning Electron Microscopy and X-ray Microanalysis,
Plenum Press, New York 1981. L. Reimer: Scanning Electron Microscopy,
Springer-Verlag, SLT 1985.