TKT-1516 DESIGN FOR TESTABILITY, 3 cr
|
Courses persons responsible
Olli Vainio
Lecturers
Olli Vainio
Implementations
Period 1 | Period 2 | Period 3 | Period 4 | Period 5 | Summer | |
Lecture | - | - | - | 2 h/week | 2 h/week | - |
Exam |
Objectives
To learn design for testability for digital circuits and systems-on-chip.
Content
Content | Core content | Complementary knowledge | Specialist knowledge |
1. | Fault models in digital circuits.
Fault detection. |
Fault models for memories. | Shared use of package pins. |
2. | Scan architecture and its use for testing. | Test development using Boolean algebra. | Special clocking arrangements. |
3. | Built-in self test. | ATPG principles. | ATPG design rules. |
4. | Testing memories and processor cores. | Features of core processors. | MBIST integration. |
5. | Terminology of the field. | The test wrapper. | Wrapper-originating requirements for DFT. |
Requirements for completing the course
Exam
Evaluation criteria for the course
Study material
Type | Name | Auhor | ISBN | URL | Edition, availability... | Exam material | Language |
Book | Design for Test for Digital IC | A. L. Crouch | 0-13-084827-1 | http://www.phptr.com | Yes | English | |
Book | Fault Tolerant & Fault Testable Hardware Design | Parag K. Lala | 0-13-308248-2 | No | English |
Prerequisites
Prequisite relations (Sign up to TUT Intranet required)
Additional information about prerequisites
Basics of digital design and integrated circuits are required as prerequisites.
Remarks
The course is lectured only every other year. Not lectured in 2007-2008.
Distance learning
- In information distribution via homepage, newsgroups or mailing lists, e.g. current issues, timetables
- Contact teaching: 20 %
- Distance learning: 0 %
- Proportion of a student's independent study: 80 %
Scaling
Methods of instruction | Hours |
Lectures | 36 |
Assignments | 14 |
Study materials | Hours |
Books | 32 |
Total sum | 82 |
Principles and starting points related to the instruction and learning of the course
Additional information related to course
The course is given only every other year.
Correspondence of content
TKT-1510 Design for Testability
Last modified | 08.06.2007 |
Modified by | Olli Vainio |