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Course Catalog 2010-2011
MOL-3416 Electron Microscopy, 5 cr |
Person responsible
Toivo Lepistö
Lessons
| Study type | P1 | P2 | P3 | P4 | Summer | Implementations | Lecture times and places |
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Learning outcomes
To understand the basics of electron optical instruments including operation, image and contrast formation. To understand basics of scanning electron microscopy and microanalysis. To apply this information in pactical excercises. To identify the main specimen praparation techniques
Content
| Content | Core content | Complementary knowledge | Specialist knowledge |
| 1. | 1. SEM structure and operation 2. Image and contrast formation 3. Microanalysis 4. Specimen preparation 5. Special techniques and operation modes 6. Exampes/Applications |
Study material
| Type | Name | Author | ISBN | URL | Edition, availability, ... | Examination material | Language |
| Book | Scanning Electron Microscopy | L.Reimer | English | ||||
| Book | Scanning Electron Microscopy and X-ray Microanalysis | J.I.Goldstein | English | ||||
| Summary of lectures | Pyykäisyelektronimikroskopia | Toivo Lepistö | Suomi |
Prerequisites
| Course | Mandatory/Advisable | Description |
| MOL-1410 Research Methods in Materials Science 1 | Advisable |
Prerequisite relations (Requires logging in to POP)
Correspondence of content
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More precise information per implementation
| Implementation | Description | Methods of instruction | Implementation |