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Course Catalog 2010-2011
TKT-1527 Digital System Design Issues, 5 cr |
Person responsible
Olli Vainio
Lessons
| Study type | P1 | P2 | P3 | P4 | Summer | Implementations | Lecture times and places |
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Requirements
Exam and compulsory exercise works.
Learning outcomes
After completing the course the student can - Describe common models of computation - Explain the principles of scan testing - Generate tests for simple example circuits using common fault models - Explain key terminology related to digital circuit testing - Identify sources of power dissipation in digital circuits - Propose techniques to control power dissipation - Classify MEMS application areas and give examples of MEMS products
Content
| Content | Core content | Complementary knowledge | Specialist knowledge |
| 1. | Design for testability | ||
| 2. | Low-power design | ||
| 3. | Models of computation | ||
| 4. | MEMS |
Study material
| Type | Name | Author | ISBN | URL | Edition, availability, ... | Examination material | Language |
| Book | CMOS VLSI Design | Weste and Harris | 0-321-26977-2 | English | |||
| Lecture slides | Digital Integrated Circuits | Rabaey, Chadrakasan and Nikolic | English | ||||
| Other online content | Complexity of Algorithms | Laszlo Lovasz | English |
Additional information about prerequisites
General basics of digital circuits and computers
are assumed as prerequisites.
Prerequisite relations (Requires logging in to POP)
Correspondence of content
There is no equivalence with any other courses
More precise information per implementation
| Implementation | Description | Methods of instruction | Implementation |